3D orientation data – A comparison of diffraction contrast tomography and serial sectioning electron backscatter diffraction for the nickel-base superalloy IN738LC

authored by: Silvia Reschka, Gregory Gerstein, Sebastian Herbst, Lukas Munk, Peter Wriggers, Hans Jürgen Maier
Abstract: For specimen characterization, X-ray microscopy offers a variety of advantages like non-destructive investigations and reduced preparation effort for the samples. Orientation measurements are possible using diffraction contrast tomography (DCT). However, lateral resolution is lower as compared to scanning electron microscopy combined with electron backscatter diffraction (EBSD). A sample of a nickel-based superalloy IN738LC was investigated three-dimensionally for direct comparison of EBSD and DCT, which clearly reveals the advantages, disadvantages and limits of both methods. Images obtained by EBSD showed more microstructural details, but also artefacts resulting from the previous sample preparation. DCT seemed more suitable for 3D-imaging, but was not able to resolve some of the smaller grains.
Organisation(s): Institute of Materials Science
Institute of Continuum Mechanics
Type: Article
Journal: Materials letters
Volume: 262
ISSN: 0167-577X
Publication date: 01.03.2020
Publication status: Published
Peer reviewed: Yes
ASJC Scopus subject areas: General Materials Science, Condensed Matter Physics, Mechanics of Materials, Mechanical Engineering
Electronic version(s): https://doi.org/10.1016/j.matlet.2019.127177 (Access: Closed)
: Details in the research portal "Research@Leibniz University"

BibTeX

@article{216ef28878714efdb031fdacd98436cc,
title = "3D orientation data – A comparison of diffraction contrast tomography and serial sectioning electron backscatter diffraction for the nickel-base superalloy IN738LC",
abstract = "For specimen characterization, X-ray microscopy offers a variety of advantages like non-destructive investigations and reduced preparation effort for the samples. Orientation measurements are possible using diffraction contrast tomography (DCT). However, lateral resolution is lower as compared to scanning electron microscopy combined with electron backscatter diffraction (EBSD). A sample of a nickel-based superalloy IN738LC was investigated three-dimensionally for direct comparison of EBSD and DCT, which clearly reveals the advantages, disadvantages and limits of both methods. Images obtained by EBSD showed more microstructural details, but also artefacts resulting from the previous sample preparation. DCT seemed more suitable for 3D-imaging, but was not able to resolve some of the smaller grains.",
keywords = "Electron microscopy, Grain boundaries, Microstructure, X-ray techniques",
author = "Silvia Reschka and Gregory Gerstein and Sebastian Herbst and Lukas Munk and Peter Wriggers and Maier, {Hans J{\"u}rgen}",
note = "Funding information: The authors gratefully acknowledge financial support by Deutsche Forschungsgemeinschaft (DFG) through grant no. 282253287 . The XRM used was also funded by the DFG (grant no. 316923185 ).",
year = "2020",
month = mar,
day = "1",
doi = "10.1016/j.matlet.2019.127177",
language = "English",
volume = "262",
journal = "Materials letters",
issn = "0167-577X",
publisher = "Elsevier",
}